STATISTICS OF SWITCHING-TIME JITTER FOR A TUNNEL DIODE THRESHOLD-CROSSING DETECTOR.
MASSACHUSETTS INST OF TECH CAMBRIDGE RESEARCH LAB OF ELECTRONICS
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As a step toward obtaining a procedure for modeling randomness occurring in electronic switching circuits, the switching randomness, or jitter, arising in a tunnel-diode switch was investigated. Distributions of the switching time were measured for a tunnel-diode switching circuit that was driven by a slowly rising current ramp. A model was deduced from these measurements which relates the statistics of the jitter to the slope of the input ramp, the load resistance, and the tunnel-diode characteristics in the vicinity of the current peak the amount of shot noise, junction capacitance, and i-v relation curvature. For switching in the reverse direction -- from the valley of the i-v relation back to the initial state -- the switching randomness involves a different mechanism. Another model is presented for this case. This model relates the jitter to the 1f noise that predominates in the valley region of the tunnel diode.
- Electrical and Electronic Equipment