SPATIAL INTENSITY DISTRIBUTION AND COLOR ANALYZER
AEROSPACE RESEARCH LABS WRIGHT-PATTERSON AFB OH WRIGHT-PATERSON AFB United States
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Research leading to new and more advanced imaging devices requires extensive study of large quantities of different semiconductor plates. Very useful in this endeavor is the Spatial Intensity Distribution and Color Analyzer SIDCA which, if used properly in connection with a stigmatic spectrograph, reduces the number of spectrographic plates needed for analyzing a target plate from a prohibitively large number to a reasonable one. SIDCA is a specially designed and built opto-electronic scanner using three photomultipliers in connection with suitable filtering, nonlinear amplification techniques, and an analog computer. It can be used in an intensity or spectral analyzing mode. In spectrographic plates, SIDCA can detect information which is not readily perceivable by the human eye. Furthermore, it can map the flaws and spatial uniformity of potential target plates or optical elements by directly scanning them in a transmission or reflection mode. Also, it can show the spatial distribution as a result of diffusion when employing spot doping and can be used for studying spatial effects of emissions from excited semiconductors. It may be used for determining the spatial homogeneity of optical elements such as interference filters, etc. When using appropriate filter-photomultiplier combinations, SIDCA can identify colors in the standardized CIE color triangle then, the analog computer performs the mathematical operations which result in the presentation of the appropriate locus in the triangle on an oscilloscope, where the parabolic portion of the triangle is obtained by scanning a low leakage verlauf filter or using a suitable, variable monochromator.