USE OF THE ELLIPSOMETER IN THE MEASUREMENT OF THIN FILMS.
Technical rept. Jul 65-Oct 66,
ARMY WEAPONS COMMAND ROCK ISLAND ILL RESEARCH AND ENGINEERING DIV
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Work was performed to outline procedures for use of the ellipsometer in thin film measurement for basic studies on corrosion and corrosion inhibition. The Poincare sphere was used as a geometrical model to analyze ellipsometer readings in terms of polarization forms of light. Changes in polarization form were used to obtain thickness and refractive index of thin films of adsorbed inhibitors or corrosion products. A five-layer barium stearate film and adsorbed monolayers of stearic acid on chrome were measured. Conclusions are that procedures outlined in the report give results consistent with published results. Ellipsometry measures films with thickness of the order of molecular dimensions. Film growth in adsorption and corrosion processes can be observed beginning in their earliest stages.
- Properties of Metals and Alloys
- Test Facilities, Equipment and Methods