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Accession Number:
AD0656609
Title:
SIZE EFFECTS IN THE TEMPERATURE VARIATION OF ELECTRICAL CONDUCTIVITY OF EPITAXIAL GOLD FILMS,
Descriptive Note:
Corporate Author:
ILLINOIS UNIV URBANA COORDINATED SCIENCE LAB
Report Date:
1967-08-01
Pagination or Media Count:
100.0
Abstract:
Measurements of the resistivity of evaporated epitaxial gold films were made over the temperature range 4.2 to 300K. A computerized data analysis scheme, in which the operator played the part of a judgement element in the feedback loop, was used to fit the Fuchs-Sondheimer theory of size effects to the experimental data. The results for films thinner than 4000 A are that the degree of specularity, p, varied between 0.5 and 0.95, while the static lattice imperfection resistance, oi, varied between 5.2 and 9.0 x 10 to the minus 8th power ohm-cm. An anomalously high film resistivity in the temperature range 15 to 60K was observed. It was attributed to small angle electron-phon scattering. Date for films thicker than 4000 A could not be fit exactly to the Fuchs-Sondheimer theory below 15K and above 77K by a single set of the parameters p and o. The cause of this mismatch is unknown. Measurements on an 8.56 micron thick gold film indicate that the lattice resistivity between 8 and 20K varied as T4.4. The gold films, of thickness between 1300 A and 8.56 A, were vacuum deposited at rates in excess of 30 Asec onto Tanganika muscovite mica held at 300C. The films were vacuum annealed before they were cooled to room temperature. They were removed from the vacuum and mounted in a liquid helium dewar. Measurements of thin film resistivity vs. temperature were automatically recorded on punched paper tape. A computer program was written to numerically calculate the Fuchs-Sondeimer integral for size effects on the electrical conductivity. A CDC 1604 computer was used to make the theoretical computations. Author
Distribution Statement:
APPROVED FOR PUBLIC RELEASE
