Accession Number:

AD0653653

Title:

NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH.

Descriptive Note:

Tri-annual technical rept. no. 3, 1 Oct 66-31 Jan 67,

Corporate Author:

MINNESOTA UNIV MINNEAPOLIS ELECTRON TUBE RESEARCH LAB

Personal Author(s):

• VAN DER Ziel,A.

Report Date:

1967-05-01

Pagination or Media Count:

41.0

Abstract:

The paper contains a study of noise in secondary electron conduction vidicons and in channel multipliers. In image intensifiers the noise is somewhat larger than the amplified shot noise of the primary current and drops to full shot noise of the amplified current at high frequencies. More noise measurements are reported in transmission secondary electron multipliers. At high gains the output becomes noisy, and the noise consists of spikes in the output current this is attributed to breakdown in the KCl layer. A theoretical interpretation of the observations is given. A detailed study is made of noise in television pick-up devices. The cases discussed are uniform illumination, single picture is illuminated, electron picture is scanned over an aperture, long integration time and short sweep time devices with multiplication between photocathode and target. Author

Descriptors:

• *MEASUREMENT
• *ELECTRON MULTIPLIERS
• NOISE
• IMAGE INTENSIFIERS(ELECTRONICS)
• VIDICONS
• CHANNEL SELECTORS
• HIGH FREQUENCY
• SCANNING
• ELECTRON TUBES
• TIME
• AMPLIFIERS
• SECONDARY EMISSION
• TELEVISION EQUIPMENT
• ILLUMINATION
• PHOTOCATHODES
• ICONOSCOPES
• SIGNAL TO NOISE RATIO

Subject Categories:

• Electrooptical and Optoelectronic Devices
• Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE