Accession Number:

AD0652468

Title:

EQUIPMENT ON SEMICONDUCTORS AND METHOD OF RADIO WAVE MAPPING,

Descriptive Note:

Corporate Author:

FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s):

Report Date:

1967-03-17

Pagination or Media Count:

28.0

Abstract:

The practical value and promising outlook of using radio wave mapping for geological surveys is quite apparent and the necessity of introducing this method is obvious. The PINP-1 and PINP-1M semiconductor field intensity meters are used for this purpose. The latest version of this meter, the PINP-2, is examined. The conditions under which these meters operate are considered and details are given on their performance. Author

Subject Categories:

  • Cartography and Aerial Photography
  • Geology, Geochemistry and Mineralogy
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE