EFFECTIVE MASS OF FREE CARRIERS IN SEMICONDUCTORS AS DETERMINED FROM INFRARED REFLECTIVITY MEASUREMENTS,

Dixon,Jack R.

Accession Number:

AD0650867

Title:

EFFECTIVE MASS OF FREE CARRIERS IN SEMICONDUCTORS AS DETERMINED FROM INFRARED REFLECTIVITY MEASUREMENTS,

Descriptive Note:

Corporate Author:

NAVAL ORDNANCE LAB WHITE OAK MD

Personal Author(s):

Dixon,Jack R.

Report Date:

1967-02-01

Pagination or Media Count:

55.0

Abstract:

Methods are reviewed by which free carrier effective masses of semiconductors are determined from measurements of the infrared reflectivity at normal incidence. This effective mass is referred to as the electric susceptibility mass, m sub s. The theory upon which the measurements are based is developed. Relationships between M sub s and various types of electronic band structure are discussed in considerable detail. Several examples are presented which illustrate the usefulness of such measurements in studying the basic electronic properties of semiconductors. Author

Accession Number:

AD0650867

Title:

EFFECTIVE MASS OF FREE CARRIERS IN SEMICONDUCTORS AS DETERMINED FROM INFRARED REFLECTIVITY MEASUREMENTS,

Descriptive Note:

Corporate Author:

NAVAL ORDNANCE LAB WHITE OAK MD

Personal Author(s):

Report Date:

1967-02-01

Pagination or Media Count:

55.0

Abstract:

Descriptors:

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE