PHYSICAL EVALUATION OF THIN FILMS OF SOLID STATE MATERIALS.
Final rept., 1 Dec 65-30 Nov 66,
MANLABS INC CAMBRIDGE MASS
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Experimental methods include reflection electron diffraction, X-ray diffraction and fluorescent analysis, electron probe microanalysis and light microscopy in addition to the determination of specific properties, such as density, hardness and index of refraction. The materials submitted for analysis include electrodeposits of copper on single crystal copper substrates, vapor deposits of boron phosphide and silicon carbide on selected substrate hosts, high perfection germanium, synthetic and natural spinels and crystals of lithium germanate, calcium tartrate and cuprous chloride. In addition, special services such as crystal orientation and cutting have been performed. Author
- Solid State Physics