Accession Number:
AD0645765
Title:
RADIATION EFFECTS ON ELECTRONIC PARTS AND MATERIALS.
Descriptive Note:
Quarterly rept. no. 1, 15 Jun-14 Sep 66,
Corporate Author:
IBM FEDERAL SYSTEMS DIV OWEGO N Y ELECTRONICS SYSTEMS CENTER
Personal Author(s):
Report Date:
1966-12-01
Pagination or Media Count:
23.0
Abstract:
A series of radiation tests has been completed on mice, Mylar, and polystyrene dielectrics at the Physics International Advanced Flash X-Ray Facility. Capacitors were tested to measure the induced current and replenishment charge as a function of voltage, dose rate, and temperature. Data analysis is not complete however, relative observations are presented for each dielectric exposed to the short pulse and high radiation level. Author
Descriptors:
Subject Categories:
- Electrical and Electronic Equipment
- Radioactivity, Radioactive Wastes and Fission Products