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Accession Number:
AD0645664
Title:
IMPROVED HIGH-SPEED INFRARED MAPPING FOR RELIABILITY ASSESSMENT OF MICROCIRCUITRY.
Descriptive Note:
Research and development rept. Feb 65-Apr 66,
Corporate Author:
NAVY ELECTRONICS LAB SAN DIEGO CALIF
Report Date:
1966-09-01
Pagination or Media Count:
48.0
Abstract:
Describes modifications to equipment and improved capability in IR mapping since first-generation system described in NEL Report 1272. High-resolution test mappings were successfully made at map-to-object magnifications up to 144x, in 3 minutes, and at environmental temperatures of 45 C to 55 C. Author
Distribution Statement:
APPROVED FOR PUBLIC RELEASE