IMPROVED HIGH-SPEED INFRARED MAPPING FOR RELIABILITY ASSESSMENT OF MICROCIRCUITRY.
Research and development rept. Feb 65-Apr 66,
NAVY ELECTRONICS LAB SAN DIEGO CALIF
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Describes modifications to equipment and improved capability in IR mapping since first-generation system described in NEL Report 1272. High-resolution test mappings were successfully made at map-to-object magnifications up to 144x, in 3 minutes, and at environmental temperatures of 45 C to 55 C. Author
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems