Accession Number:

AD0645664

Title:

IMPROVED HIGH-SPEED INFRARED MAPPING FOR RELIABILITY ASSESSMENT OF MICROCIRCUITRY.

Descriptive Note:

Research and development rept. Feb 65-Apr 66,

Corporate Author:

NAVY ELECTRONICS LAB SAN DIEGO CALIF

Personal Author(s):

• Dean,H. F.

Report Date:

1966-09-01

Pagination or Media Count:

48.0

Abstract:

Describes modifications to equipment and improved capability in IR mapping since first-generation system described in NEL Report 1272. High-resolution test mappings were successfully made at map-to-object magnifications up to 144x, in 3 minutes, and at environmental temperatures of 45 C to 55 C. Author

Descriptors:

• (*MICROELECTRONICS
• *RELIABILITY(ELECTRONICS))
• (*INFRARED IMAGES
• MICROELECTRONICS)
• CIRCUITS
• INFRARED RADIATION
• NONDESTRUCTIVE TESTING

Subject Categories:

• Electrical and Electronic Equipment
• Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE