Accession Number:

AD0645577

Title:

A BAYESIAN MODEL FOR TROUBLESHOOTING ELECTRONIC EQUIPMENT.

Descriptive Note:

Research rept. Jan-Jul 66,

Corporate Author:

NAVY ELECTRONICS LAB SAN DIEGO CALIF

Personal Author(s):

• Hershman,R. L.
• Freitag,M.

Report Date:

1966-11-09

Pagination or Media Count:

22.0

Abstract:

Bayes Theorem is applied to the problem of formulating an optimum strategy for the troubleshooting of equipment failures. The probabilities attaching to hypotheses about the various possible causes of system failure are modified according to the theorem, and the process of testing and replacing components is structured so as to minimize the expected total cost of system restoration. Author

Descriptors:

• (*FAILURE(ELECTRONICS)
• MATHEMATICAL MODELS)
• FAILURE
• ELECTRONIC EQUIPMENT
• MAINTENANCE

Subject Categories:

• Statistics and Probability

Distribution Statement:

APPROVED FOR PUBLIC RELEASE