Accession Number:

AD0645262

Title:

THIN-FILM POLYCRYSTALLINE FIELD-EFFECT TRIODE.

Descriptive Note:

Quarterly rept. no. 1, 1 Jul-30 Sep 66,

Corporate Author:

RADIO CORP OF AMERICA SOMERVILLE N J DEFENSE MICROELECTRONICS

Personal Author(s):

• Topfer,M. L.
• Fabula,J. J.
• Rapp,A. K.
• Schelhorn,R. L.

Report Date:

1966-12-01

Pagination or Media Count:

29.0

Abstract:

Life test data are presented on thin-film transistors which have been on load life test for over 2,000 hours. Some of the problems associated with the masking technique used to fabricate the four-input NOROR gate circuit are discussed. Testing procedures to be used to evaluate the circuit are discussed in detail. Some of the test data on the initial circuits fabricated are presented. Author

Descriptors:

• *FIELD EFFECT TRANSISTORS
• FILMS
• LIFE EXPECTANCY(SERVICE LIFE)
• MICROSTRUCTURE
• CADMIUM SULFIDES
• CADMIUM SELENIDES
• SILICON COMPOUNDS
• OXIDES
• PHOTOELECTRIC EFFECT
• CAPACITANCE
• VOLTAGE
• INTERFACES
• GATES(CIRCUITS)
• INTEGRATED CIRCUITS

Subject Categories:

• Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE