THIN-FILM POLYCRYSTALLINE FIELD-EFFECT TRIODE.
Quarterly rept. no. 1, 1 Jul-30 Sep 66,
RADIO CORP OF AMERICA SOMERVILLE N J DEFENSE MICROELECTRONICS
Pagination or Media Count:
Life test data are presented on thin-film transistors which have been on load life test for over 2,000 hours. Some of the problems associated with the masking technique used to fabricate the four-input NOROR gate circuit are discussed. Testing procedures to be used to evaluate the circuit are discussed in detail. Some of the test data on the initial circuits fabricated are presented. Author
- Electrical and Electronic Equipment