Accession Number:

AD0645221

Title:

PROCEEDINGS OF THE CONFERENCE ON RELIABILITY OF SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS, VOLUME I, 17, 18 AND 19 JUNE 1964, NEW YORK, N. Y.

Descriptive Note:

Corporate Author:

OFFICE OF THE DIRECTOR OF DEFENSE RESEARCH AND ENGINEERING WASHINGTON DC ADVISORY GROUP ON ELECTRON DEVICES

Personal Author(s):

Report Date:

1964-06-19

Pagination or Media Count:

204.0

Abstract:

Contents Internal reliability support effort at USAEL for the PEM program Reliability improvement on VHF amplifier designs and processes Step stress testing as a means of evaluating reliability of the PNP silicon alloy transistor Improving the reliability of the PNP silicon alloy transistor Reliability improvement of 2N336 and 2N2193 transistors Preparation and effects of dislocations and resistivity of germanium single crystals A universal test set for the measurement of thermal resistance The use of infra-red techniques for transistor thermal resistance measurement Improved reliability by means of material selection and production sampling Application of ultrasonic energy to eutectic wafer bonding of transistors Reliability improvements Reliability verification of microcircuits through accelerated testing Current microelectronic reliability testing in relation to silicon semiconductor networks Reliability improvement process evaluation.

Subject Categories:

  • Electrical and Electronic Equipment
  • Fabrication Metallurgy
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE