THIN-FILM SHIELDING TECHNIQUE.
ARMY ELECTRONICS COMMAND FORT MONMOUTH N J
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A test instrument and measurement technique was devised to study the electromagnetic shielding properties of vacuum-deposited thin metallic films for applications in microelectronic circuitry and equipments. The test procedure is described, design information for the construction of the test device is given, and a theoretical basis for its use is presented. Author
- Electrical and Electronic Equipment