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Accession Number:
AD0645139
Title:
THIN-FILM SHIELDING TECHNIQUE.
Descriptive Note:
Technical rept.,
Corporate Author:
ARMY ELECTRONICS COMMAND FORT MONMOUTH N J
Report Date:
1966-11-01
Pagination or Media Count:
44.0
Abstract:
A test instrument and measurement technique was devised to study the electromagnetic shielding properties of vacuum-deposited thin metallic films for applications in microelectronic circuitry and equipments. The test procedure is described, design information for the construction of the test device is given, and a theoretical basis for its use is presented. Author
Distribution Statement:
APPROVED FOR PUBLIC RELEASE