MILLIMETER AND SUBMILLIMETER WAVE DIELECTRIC MEASUREMENTS WITH AN INTERFERENCE SPECTROMETER.
GEORGIA INST OF TECH ATLANTA ENGINEERING EXPERIMENT STATION
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Applications of an interference spectrometer in measuring complex permittivity of dielectric materials are described. An interferometer technique is employed for the dielectric constant measurements and an error analysis is included in this discussion. The loss tangent measurements use a power spectrum technique in which wide resolution bandwidth is used to average out the effects of multiple reflections introduced by a sample of finite thickness. Results of dielectric constant measurements at 71 GHz and 250-450 GHz are tabulated along with results of loss tangent measurements at 400, 600, and 1000 GHz for several commonly employed materials of interest to microwave systems engineers. Author
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