MICROELECTRONIC STUDIES, TASK 1. FEASIBILITY STUDY OF EMPIRICAL SCREENING METHODS, TASK 2. MODELING OF TRANSIENT BEHAVIOR.
Final rept. 25 Jun 65-25 Mar 66,
BATTELLE MEMORIAL INST COLUMBUS OHIO COLUMBUS LABS
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Screening techniques were studied which were potentially useful for silicon integrated circuits. Based on experiments with simple NOR gates, parameters measuring low-frequency noise and transfer characteristics appear to be feasible. Certain transient parameters were developed and studied for potential screening. The purpose was to extend the parameters to another type of circuit and determine whether a correlation existed between assumed changes in the internal parameters of a NOR gate and resulting changes of the characteristic parameters. Author
- Electrical and Electronic Equipment