Accession Number:

AD0644195

Title:

RELIABILITY IN MICROELECTRONICS,

Descriptive Note:

Corporate Author:

ROME AIR DEVELOPMENT CENTER GRIFFISS AFB N Y

Personal Author(s):

Report Date:

1966-10-01

Pagination or Media Count:

14.0

Abstract:

The paper reviews the current and anticipated future reliability requirements for microelectronic devices and compares these to the present reliability levels. The quality problem as it affects reliability is discussed in some detail. Data is derived from various equipment development programs and investigations of integrated circuit quality and reliability. In recognition of the fact that the produce microelectronic devices does not yet meet the promise, some of the problems and interim solutions are discussed in detail. The effectiveness of various acceptance and screening procedures for integrated circuits is evaluated. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE