Accession Number:

AD0643858

Title:

RADIATION BACKSCATTERING AND RADIATION-INDUCED X-RAYS FOR MEASURING SURFACE COMPOSITION AND STRUCTUR

Descriptive Note:

Corporate Author:

FRANKFORD ARSENAL PHILADEDLPHIA PA PITMAN-DUNN RESEARCH LABS

Personal Author(s):

Report Date:

1966-06-01

Pagination or Media Count:

7.0

Abstract:

The use of promethium-147 beta backscattering to measure the thickness of plastic coatings on copper was determined. Backscattering radiation was also used to determine the structure and surface composition of copper specimens. A preliminary study of the use of beta-particle backscattering and beta-particle-induced X-rays for measuring corrosion is described.

Subject Categories:

  • Properties of Metals and Alloys
  • Nuclear Instrumentation

Distribution Statement:

APPROVED FOR PUBLIC RELEASE