RELIABILITY SCREENING USING INFRARED RADIATION.
Final technical rept., Jun 64-May 66,
SYLVANIA ELECTRIC PRODUCTS INC WOBURN MASS SEMICONDUCTOR DIV
Pagination or Media Count:
A program was conducted to determine the feasibility of developing a process whereby transistors which have a high probability of failing during their lifetime can be screened from a lot of similiar but reliable transistors on the basis of their infrared output while operating under normal electrical conditions. The report includes discussions of the mode of operation of the infrared instrumentation used in the program and details of the life tests which were conducted. Author
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems