Accession Number:

AD0641673

Title:

STUDY OF EFFECT OF HIGH-INTENSITY PULSED NUCLEAR RADIATION ON ELECTRONIC PARTS AND MATERIALS (SCORRE)

Descriptive Note:

Rept. no. 6 (Final), 15 Jun 64-15 Jul 66

Corporate Author:

IBM FEDERAL SYSTEMS DIV OWEGO NY ELECTRONICS SYSTEMS CENTER

Personal Author(s):

• Boczar, Paul G.
• Boyd, Gilbert E.
• Cordwell, Wayne A.
• Frankovsky, Frank A.

Report Date:

1966-10-01

Pagination or Media Count:

74.0

Abstract:

The report describes the radiation-induced behavior of tantalum-oxide, mica, ceramic, Mylar, glass, and polystyrene capacitors using results obtained at several sources. Also included are discussions of the following Experimental techniques at each radiation source, including measurement of circuits, components, dosimetry, and variation of circuit and radiation parameters Results from SPRF, LINAC, and AFXR tests describing the dependences of the induced current for the irradiated dielectric Interpretation of these results in terms of appropriate models and radiation and circuit parameters Comparison of the effects observed at each irradiation source Description of the tests on magnetics and the test results. Author

Descriptors:

• *DAMAGE
• *ELECTRONIC EQUIPMENT
• *CAPACITORS
• DIELECTRICS
• STYRENE PLASTICS
• DATA STORAGE SYSTEMS
• MAGNETIC CORES
• POLYESTER PLASTICS
• CERAMIC CAPACITORS
• GLASS CAPACITORS
• MICA CAPACITORS
• TANTALUM CAPACITORS

Subject Categories:

• Electrical and Electronic Equipment
• Radioactivity, Radioactive Wastes and Fission Products

Distribution Statement:

APPROVED FOR PUBLIC RELEASE