Accession Number:

AD0640462

Title:

THE SELECTION OF FAILURE LOCATION TESTS BY PATH SENSITIZING TECHNIQUES,

Descriptive Note:

Corporate Author:

ILLINOIS UNIV URBANA COORDINATED SCIENCE LAB

Personal Author(s):

Report Date:

1966-08-01

Pagination or Media Count:

58.0

Abstract:

A method of deriving test sequences that utilizes path sensitizing techniques is presented. The tests are designed to locate diagnose faults in combinational logic networks. The basic strategy is to pick a fault to be tested and sensitize paths, some of which go through the fault. A path is sensitized if the associated test checks for faults along the path therefore the main objective is to find a set of tests which will determine if the fault has occurred. The proposed method of test selection is compared to other techniques in current use and is shown to produce at least as good a set of tests as the others give even though the path sensitizing method uses less time or less computer memory space. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Computer Hardware

Distribution Statement:

APPROVED FOR PUBLIC RELEASE