FIELD ION MICROSCOPY AND A STUDY OF THE TUNGSTEN-CARBON ALLOY SYSTEM
BROWN UNIV PROVIDENCE RI DIV OF ENGINEERING
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The Field Ion Microscope has the highest resolution yet attainable its magnification power being of the order of 1,000,000 X. A review of technique and theory shows that the microscope has a built-in capability of searching a specimen along a third dimension by removal of surface atom layers. Using the FIM to study the tungsten-carbon alloy system, this technique of evaporation allows one to investigate the distribution of carbon about slip bands and the distortion of the tungsten host lattice due to the presence of the carbon interstitial. A model is presented for determining carbon content in carburized specimens. The presence of carbides is discussed along with the effect of the interstitial atom on the tungsten surface layer. Suggestions for improvement and extended work are presented.
- Metallurgy and Metallography