STUDY OF NOISE IN SEMICONDUCTOR DEVICES.
Semi-annual technical rept. no. 1, 16 Sep 65-15 Mar 66.
MINNESOTA UNIV MINNEAPOLIS DEPT OF ELECTRICAL ENGINEERING
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The report presents the progress of experimental and theoretical investigation of noise in solid state devices such as transistors, junction and MOS FETs, PIN diodes, junction laser diodes and the like. The noise properties of microwave transistors, transistor noise at high injection levels, and transistor 1f noise at elevated temperatures are studied in particular.
- Solid State Physics
- Radio Communications