Accession Number:

AD0636283

Title:

MICROMODULE LIFE TEST PROGRAM.

Descriptive Note:

Progress rept. no. 5, 17 Sep 65-15 Apr 66.

Corporate Author:

RADIO CORP OF AMERICA CAMDEN N J COMMUNICATIONS SYSTEMS DIV

Personal Author(s):

Report Date:

1966-04-15

Pagination or Media Count:

65.0

Abstract:

Progress is reported on a micromodule life test program to determine the Mean-Time-To-Failure MTTF of a typical analog and a typical digital micromodule when tested for ten-thousand 10,000 hours under load at elevated temperature. The causes of micromodule failure during test are to be determined and reported to each supplier of test modules, and at the conclusion of testing, drift characteristics of each micromodule parameter are to be studied to determine attainable tolerance limits for these parameters.

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE