Accession Number:

AD0631972

Title:

MICROCIRCUIT RELIABILITY PREDICTION METHODS.

Descriptive Note:

Research rept. for Jul 65-Feb 66,

Corporate Author:

NAVY ELECTRONICS LAB SAN DIEGO CALIF

Personal Author(s):

Report Date:

1966-03-11

Pagination or Media Count:

15.0

Abstract:

A survey of possible test methods, and some exploratory work, showed that the most promising methods for the reliability screening of microcircuits are conventional electrical tests special electrical tests such as rf noise measurement and use of the ring-counter technique infrared temperature measurement and visual inspection. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE