MICROCIRCUIT RELIABILITY PREDICTION METHODS.
Research rept. for Jul 65-Feb 66,
NAVY ELECTRONICS LAB SAN DIEGO CALIF
Pagination or Media Count:
A survey of possible test methods, and some exploratory work, showed that the most promising methods for the reliability screening of microcircuits are conventional electrical tests special electrical tests such as rf noise measurement and use of the ring-counter technique infrared temperature measurement and visual inspection. Author
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems