A PRECISE DETERMINATION OF INTERPLANAR SPACING FROM DIVERGENT BEAM PHOTOGRAPHS.
Technical rept. no. 1, Sep 65-Apr 66,
RUTGERS - THE STATE UNIV NEW BRUNSWICK N J MATERIALS RESEARCH LAB
Pagination or Media Count:
Precise lattice parameter determination by means of the divergent x-ray beam method is simplified by placing a wire grid between film and specimen, and employing a double-exposure technique. Shadows cast by the grid appear as breaks in the ellipses of the pattern. The film coordinates of these breaks are utilized to calculate the d-values of the reflecting planes. Author
- Test Facilities, Equipment and Methods