Accession Number:

AD0631179

Title:

A PRECISE DETERMINATION OF INTERPLANAR SPACING FROM DIVERGENT BEAM PHOTOGRAPHS.

Descriptive Note:

Technical rept. no. 1, Sep 65-Apr 66,

Corporate Author:

RUTGERS - THE STATE UNIV NEW BRUNSWICK N J MATERIALS RESEARCH LAB

Personal Author(s):

Report Date:

1966-04-01

Pagination or Media Count:

9.0

Abstract:

Precise lattice parameter determination by means of the divergent x-ray beam method is simplified by placing a wire grid between film and specimen, and employing a double-exposure technique. Shadows cast by the grid appear as breaks in the ellipses of the pattern. The film coordinates of these breaks are utilized to calculate the d-values of the reflecting planes. Author

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Crystallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE