Accession Number:

AD0630930

Title:

MEASUREMENT OF MINORITY CARRIER LIFETIME IN GERMANIUM AND SILICON BY THE SPREADING RESISTANCE PHOTO DECAY METHOD. CALORIMETRIC METHOD OF MEASURING ABSORBED POWER IN ELECTROLUMINESCENCE,

Descriptive Note:

Corporate Author:

ARMY FOREIGN SCIENCE AND TECHNOLOGY CENTER WASHINGTON D C

Report Date:

1965-12-01

Pagination or Media Count:

26.0

Abstract:

The photo-conductive decay of spreading resistance in contact with germanium and silicon of different surface conditions, subjected to photo-excitation of different spectral compositions was studied and a simple method for the measurement of semi-conductor lifetime is presented. The second paper describes the use of calorimetric method to measure electric power absorption in electroluminescence. The method is based on the principle of conservation of energy therefore, effects of harmonics and frequency in the measurement are eliminated. Preliminary experimental results indicate measurement error for readings under five microwatts mW is less than 5. Author

Subject Categories:

  • Electricity and Magnetism
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE