PRODUCTION ENGINEERING MEASURE (PEM) FOR SILICON MIXER DIODE.
Quarterly progress rept. no. 3, 1 Oct-31 Dec 65,
SYLVANIA ELECTRIC PRODUCTS INC WOBURN MASS SEMICONDUCTOR DIV
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The third engineering test sample run was initiated using the new package design based on a beryllium oxide body with an improved ceramic to metal seal and thermocompression bonding of the die. Preliminary screening of these units indicate more work may be necessary to optimize the tungsten whisker contact. Analysis of Group B test data on units from the second engineering test sample run show environmental test results considerably improved compared to those on units from the first engineering test sample run. Author
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems