ON THE MEANING OF THE FAULT PARAMETERS MEASURED BY X-RAYS; I. STRAIN DISTRIBUTIONS IN SHOCK-LOADED SINGLE CRYSTALS OF COPPER; II.
NORTHWESTERN UNIV EVANSTON ILL DEPT OF MATERIALS SCIENCE
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A comparison was made between the intensity of twin faults seen in the electron microscope and the effects on the diffraction pattern of a single crystal of copper shock-loaded at 435 kb. The Fourier coefficients of peaks like the 111, 222, 444 and 555 are effected by twin faults and that those of the 333 are not. From this fact the twin fault density can be calculated and compared with the electron microscopic results. Excellent agreement was obtained. The strain distributions in shockloaded copper was shown to be Gaussian. Author
- Metallurgy and Metallography
- Solid State Physics