PHOTOELECTRON STATISTICS FOR VARIABLE TIME AND BANDWIDTH.
DELAWARE UNIV NEWARK DEPT OF ELECTRICAL ENGINEERING
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The photoelectric measurement of optical signals may be limited both by random fluctuations in signal strength and by the probabilistic nature of the photoelectric detector. The mean square fluctuation, in number of electrons released in a photoelectric detector, illuminated by a coherent light signal in the presence of thermal noise, is calculated. The results are illustrated by a graph which shows how the dependence of the relative fluctuation in number of photoelectrons on signal strength is affected by both the time-bandwidth product and the mean number of photoelectrons per observation time. Author
- Electrical and Electronic Equipment