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PRODUCTION ENGINEERING MEASURE FOR SILICON MIXER DIODE.
Quarterly progress rept. no. 2, 1 Jul-30 Sep 65,
SYLVANIA ELECTRIC PRODUCTS INC WOBURN MASS SEMICONDUCTOR DIV
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The Second Engineering Test Sample Run has been completed using the new package design based on a beryllium oxide body with brazed metal end pieces. Test data show the design to be satisfactory from an electrical characteristic viewpoint. Analysis of Group B test data on units from the First Engineering Test Sample Run show environmental test results reasonably close to the objective AQL levels except for Moisture Resistance. Step stress analysis of storage life test data on units from the first run show a failure rate of 0.1 per 1000 hours compared to the objective 0.001. Author
APPROVED FOR PUBLIC RELEASE