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Accession Number:
AD0625452
Title:
MEASUREMENT TECHNIQUES FOR OVERSIZED WAVEGUIDE.
Descriptive Note:
Research rept.,
Corporate Author:
POLYTECHNIC INST OF BROOKLYN N Y MICROWAVE RESEARCH INST
Report Date:
1965-11-18
Pagination or Media Count:
54.0
Abstract:
The first phase of this work is concerned with the identification as well as estimating the power coupling of spurious modes in the presence of TE10, the main mode in the overmoded waveguide. The second phase would consider the measurement of known or approximately known discontinuities such as dielectric slabs and capacitive irises or steps. Precision experimental procedure carried out enables the measurement of spurious modes coupled more than 25 db below the main mode. The dielectric constant evaluated from the experimental results was surprisingly close to the previously measured and specified value. The device under study is a 6 inch square overmoded waveguide fed by a sequence of long rectangular tapers from standard S, C and X band waveguides. Author
Distribution Statement:
APPROVED FOR PUBLIC RELEASE