METAL BASE TRANSISTOR II.
Quarterly progress rept. no. 3, 1 Jan-31 Mar 65,
PHILCO BLUE BELL PA APPLIED RESEARCH LAB
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By fitting resistance versus thickness data for evaporated copper, silver, and aluminum films to the Fuchs-Sondheimer equation, the conductivity mean-free-path was determined for these metals and found to be independent of deposition rate. The minimum thickness necessary for a continuous film of silver was found to decrease with increasing deposition rate. A triode was made with a common emitter current gain of 10. A large increase in Beta with time was measured in this device, with no corresponding change in base resistance. Shorting problems have seriously hindered both triode and diode work. Considerable effort has been directed at this problem, and some progress is reported. Author