EVALUATION OF SILICON METALLIC RECTIFIERS.
Interim engineering rept. no. 11, 1 Jan-31 Mar 61.
IIT RESEARCH INST CHICAGO ILL
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Three groups of rectifiers are being subjected to life test at different ambient temperatures to determine three points on a curve of life versus ambient temperature. An accumulated test time of over 8000 hours has been represented by data gathered on the 200 C environmental group. To date, a total of 35 failures have occurred, and 10 diodes have survived the life test on this group. The 185 C and 170 C environmental groups have been subjected to over 5000 hours of experiment. At the end of 4392 hours, 30 failures had occurred for the 185 C test group and seven failures for the 170 C test group. These total failure quantities did not increase over those observed by the end of the previous quarter. Author