PRODUCTION ENGINEERING MEASURE TRANSISTOR, VHF, SILICON, POWER (25W-100MC).
Quarterly rept. no. 11, 1 Jan-31 Mar 65,
TRW SEMICONDUCTORS INC LAWNDALE CALIF
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The manufacture of preproduction samples has been delayed because of operational life testing problems which have been attributed to severe lateral thermal instability. Experiments with different metallizing systems did not offer any appreciable improvement to the direct solution of the problem but did lead to adoption of titanium-aluminum as a standard process. Since secondary breakdown has been established as the failure mode during operation life test, several improved methods of studying this phenomenon were found. The assymmetrical distribution of emitter current was established and a potential solution found which should lead to ultimate success in the ability of the devices to pass operation life tests. Production equipment and materials are being held in readiness in order to proceed with preproduction sample fabrication immediately upon solution of the life test problem. Author