A POROUS SUBSTRATE RESISTOR AIMED AT MINIATURIZATION OF METAL-FILM RESISTORS.
Interim development rept. no. 10, 1 Dec 64-28 Feb 65,
WESTON INSTRUMENTS INC NEWARK N J
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A correlation between structural characteristics of the substrate and reproducibility of resistance values is illustrated. It is advocated that the quality of the substrate can be typified by the standard deviation in weight-to-volume ratio and the standard deviation in flow. These two parameters have been combined to give a quantitative measure of substrate uniformity by defining a structure factor. In most cases, the average standard deviation in resistance is linearly proportional to the structure factor. In obtaining this correlation, it is necessary to consider groups defined by substrate type and method of terminating. It is thus a statistical result which cannot be applied to individual units or metallizing lots. Author