CAPACITANCE BETWEEN THIN-FILM CONDUCTORS DEPOSITED ON A HIGH-DIELECTRICCONSTANT SUBSTRATE.
LOCKHEED MISSILES AND SPACE CO SUNNYVALE CALIF
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The capacitance between two thin-film conductors deposited on a high-dielectric-constant substrate is calculated by means of the Schwarz-Christoffel transformation. Numerical results are calculated and compared with experimental results. Author