Accession Number:

AD0617715

Title:

PHYSICS OF FAILURE IN ELECTRONICS. VOLUME III,

Descriptive Note:

Corporate Author:

IIT RESEARCH INST CHICAGO ILL

Personal Author(s):

Report Date:

1964-01-01

Pagination or Media Count:

494.0

Abstract:

The proceedings of the 1964 symposium on the physics of failure in electronics held at the Illinois Institute of Technology in Chicago are presented. Papers are presented on Test, analysis, and correlation Surface effects Principles and applications Effects in films Bulk effects.

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE