Accession Number:

AD0617542

Title:

CHARACTERISTIC ENERGY LOSSES IN LAYERED METALLIC THIN FILMS.

Descriptive Note:

Technical rept. for 1 Feb 64-31 Jan 65,

Corporate Author:

DELAWARE UNIV NEWARK DEPT OF PHYSICS

Personal Author(s):

Report Date:

1965-01-31

Pagination or Media Count:

121.0

Abstract:

The characteristic electron energy loss spectra of layered films of Bi and Mg have been measured using a retarding potential electron energy analyzer with an electrically differentiated output to obtain the energy loss distribution directly. A new loss, that was not observed on single layer films of Mg or Bi, was found at 12.9 0.2 e.v. This loss can be interpreted as a surface plasma loss at the metal-metal interface. A surface loss in Al-Mg films was not reproducible, but a new loss was observed at 26.4 e.v. which can be interpreted as a single Al loss 15.4 ev plus a single Mg loss 10.9 ev. Chemical and physical processes such as changes in composition and aggregation at the Al-Mg interface during both the preparation and measurement of the sample may alter the interface enough to decrease the intensity of the surface plasma loss. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE