Accession Number:

AD0614103

Title:

RELIABILITY OF INTEGRATED CIRCUITS USED IN MISSILE SYSTEMS,

Descriptive Note:

Corporate Author:

BATTELLE MEMORIAL INST COLUMBUS OHIO

Report Date:

1964-10-30

Pagination or Media Count:

75.0

Abstract:

Failure rates for off-the-shelf silicon monolithic integrated circuits were established on the basis of some 68 million parttest hours of data. No failures were reported for operating-life tests at 25C, so it can be determined only that the failure rate is less than an upper 60 percent confidence limit of 0.067 percent per 1000 hours. The observed failure rate from system and field operational tests was 0.012 percent per 1000 hours 0.022 percent per 1000 hours at 60 upper confidence limit. At 125C, the observed operating-life failure rate for laboratory tests was 0.087 percent per 1000 hours. Estimated failure rates for laboratory storage tests range from 0.0055 at 25C extrapolated to 0.22 at 150C, and 2.4 at 300C.

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE