SEMICONDUCTOR LASER ARRAY TECHNIQUES (SEMLAT).
Quarterly interim rept. no. 2,
GENERAL ELECTRIC CO SYRACUSE N Y
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This report contains confirmation on the work done in the Second Quarter of the Semiconductor Laser Array Program. Further materials evaluation, construction techniques, and preliminary testing of two - diode arrays are discussed. Considerations leading to specifications of the required cryogenic equipment for testing the ultimate diode array are presented. Testing of single diodes to obtain matched pairs and the appropriate test system to detect microwave beat frequencies are described. Finally, thermal considerations leading to a proper selection of array diode spacing are presented. Author