PRODUCTION ENGINEERING MEASURE: IMPROVEMENT OF PRODUCTION TECHNIQUES TO INCREASE THE RELIABILITY OF SILICON PLANAR EPITAXIAL; TRANSISTOR (WX-4001), LOGIC GATE (WM-201), FLIPFLOP (WM-202), AC BINARY (WM-213).
Quarterly rept. no. 5, 1 Jul-30 Sep 64,
WESTINGHOUSE ELECTRIC CORP ELKRIDGE MD
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Extensive studies of assembly and lidding procedures were performed, and significant improvements in yield and reliability are expected as a result of changes in manufacturing procedures. During the period, a number of reliability tests were completed, and many additional tests were begun. Final drafts of the specifications for all devices were undertaken and are practically complete. An outline of the revised quality control manual was finalized. Quarterly samples were delivered per the contract requirements. The most important development during the period was the institution of automatic testing of all devices on the program, using an in-house designed and built automatic test system which automatically tests all DC parameters, prints out the data, and punches a tape which can be used for computer handling of the data. Author