EXPLORATORY DEVELOPMENT OF THE Q-FACTOR TECHNIQUE. SECTION 1 - RESULTS AND DISCUSSION OF FIRST NEUTRON TEST.
Quarterly progress letter no. 3,
BENDIX CORP SOUTHFIELD MICH
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This report presents damage constant comparisons for 2N1613 transistors irradiated both passively and in several operating conditions in a neutron environment of 7 x 10 to the 13th power nsq cm, E 0.1 Mev. Comparisons of damage are also made for three different temperatures during irradiation and three different measurement temperatures to determine the influence of each temperature condition. The damage constant behavior for 2N709, 2N914 and 2N1613 transistors was investigated at different levels of measurement current, from 0.00001 a to 0.1 a. Author