THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUND-BASED COMPUTER SYSTEMS. VOLUME IIIB: SIMULATED-USE LIFE-TEST DATA (DIODES).
Final rept., Vol. 3B, 30 Apr 56-31 Mar 58,
SPERRY RAND CORP ST PAUL MINN UNIVAC DEFENSE SYSTEMS DIV
Pagination or Media Count:
Presentation of Type HD2193 diode data for the simulated-use load-life experiment was designed to provide summarized statistics that could be used in a variety of computations which might arise in the design, operation, and maintenance of a ground-based computer system.