Accession Number:

AD0608137

Title:

NON-DESTRUCTIVE RELIABILITY SCREENING OF ELECTRONIC PARTS.

Descriptive Note:

Final rept.,

Corporate Author:

GENERAL MOTORS CORP KOKOMO IND DELCO RADIO DIV

Personal Author(s):

Report Date:

1964-09-01

Pagination or Media Count:

247.0

Abstract:

An extensive study of the relationship of a large number of parameters to later failure was made for germanium, high power, PNP, alloy junction transistors. The relative effectiveness of several screening approaches were tested and applications to several related device types were made to extend the applicability. A reliability screening technique which uses the time response characteristic after step application of rated diode voltage was developed. A study of the mechanism of collector diode degradation failure resulted in the establishment of a model for the mechanism of failure. A computer program was developed and is described. This program will analyze up to ninety-six measured and calculated parameters for a single experiment and establish their relative effectiveness for reliability prediction when the data cards representing later failures in the initial test decks are suitably coded. The output of this program yields a series of optimized multiparameter truncation screening plans with increasing percent removal of failures. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE