THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUND-BASED COMPUTER SYSTEMS: VOLUME VI: PHASE III, THE DEVELOPMENT OF COMPONENT-SCREENING TECHNIQUES.
Final rept. vol. 6, 30 Apr 56-31 Mar 58,
BATTELLE MEMORIAL INST COLUMBUS OHIO
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This report describes a research program directed toward the development of techniques for detecting inherently weak transistors, diodes, and resistors before they are used in the computer system. The results of this research have indicated that screening techniques based on initial parameter measurements are feasible. Trail applications of the techniques on data from exploratory and simulated-use life tests indicate that it may be possible to classify correctly as many as 80 per cent of the components destined for early failure in use. Author