THE IMPROVEMENT OF PRODUCTION TECHNIQUES TO INCREASE THE RELIABILITY OF DIFFUSED SILICON CONTROLLED SWITCHES TYPES 2N689.
Quarterly progress rept. no. 4, 1 Apr-30 Jun 64,
GENERAL ELECTRIC CO AUBURN N Y
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The report covers work performed on the device package ultrasonic welding, the tests being conducted to determine the optimum tubulation weld schedules, the evaluation of completed high-speed low-voltage all-diffused devices, the experiments conducted to re-establish gold diffusion conditions, the comparison of material from four different N-type silicon crystals and their effect on pulse turn-off times, and the summary of blocking voltage step stress test data on the alloy-diffused device. A PERT analysis depicts the progress of this program, and provides for certain conclusions based upon the work performed. Author