Accession Number:

AD0603706

Title:

A MEASUREMENT TECHNIQUE FOR VACUUMDEPOSITED THIN FILMS,

Descriptive Note:

Corporate Author:

ARMY ELECTRONICS LABS FORT MONMOUTH N J

Personal Author(s):

Report Date:

1964-04-01

Pagination or Media Count:

26.0

Abstract:

This report presents a laboratory method for the measurement of evaporated thin films in the range 10 to 10,000 Angstroms. Utilizing a multiple beam technique, employing fringes of equal chromatic order and a unique sample holder, films have been measured to a precision of 15 A. The simplicity of the components employed is an outstanding feature of the experimental system. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE