Accession Number:

AD0602114

Title:

MEASUREMENT OF RESIDUAL STRESS BY X-RAY DIFFRACTION.

Descriptive Note:

Technical rept. no. 7

Corporate Author:

MARTIN CO ORLANDO FLA

Personal Author(s):

Report Date:

1964-06-01

Pagination or Media Count:

27.0

Abstract:

For the measurement of residual stresses, x-ray diffraction is potentially the best nondestructive method available. Ex periments are described in which silicon bronze and alpha brass samples were examined by x-rays while subjected to tensile deformation. The positions of the diffraction lines and their breadths were measured and analyzed. The special features of the experimental arrangement employed are presented and the method of analysis explained. An important result of this study is the observation that the stress-strain curve obtained from the x-ray diffraction measurements follows the stress-strain curve obtained from a standard tensile test, contrary to what many previous investigators have reported with different experimental techniques. Furthermore, for materials which may form stacking faults upon deformation, the x-ray data must first be corrected for the effects produced from stacking faults before the stress is calculated. Author

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE