DESIGN AND DEVELOPMENT OF SEMICONDUCTOR TEST SET, AN/USM-171().
Quarterly rept. no. 3, 1 Jan-31 Mar 64,
AMERICAN ELECTRONIC LABS INC COLMAR PA
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The ANUSM-171 Study and Design Plan phase delineated the feasibility of the approach for the Beta Measurement and Automatic Lead Selector. The major unknown was in-circuit leakage measurement. During the development and breadboarding in the first quarter, a significant breakthrough in the state-of-the-art measurement techniques for extracting the minute leakage current from the massive in-circuit shunt current was demonstrated. In the second quarter, a 101 improvement in leakage measurement capability was achieved. During this third quarter, an intensive design and breadboard verification test phase which concentrated on the emitter finding and low range leakage measurement circuits for the ANUSM-171 Test Set was accomplished. Final fabrication of the in circuit probe using permanent tooling was accomplished and a value engineering analysis undertaken. Author